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The Resource Microelectronics failure analysis techniques : a procedural guide, compiled & edited by Ed Doyle, Jr., Bill Morris

Microelectronics failure analysis techniques : a procedural guide, compiled & edited by Ed Doyle, Jr., Bill Morris

Label
Microelectronics failure analysis techniques : a procedural guide
Title
Microelectronics failure analysis techniques
Title remainder
a procedural guide
Statement of responsibility
compiled & edited by Ed Doyle, Jr., Bill Morris
Creator
Contributor
Subject
Language
eng
Related
Cataloging source
CPaHP
Funding information
Sponsored by the Air Force Systems Command, Rome Air Development Center, Griffiss Air Force Base.
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Label
Microelectronics failure analysis techniques : a procedural guide, compiled & edited by Ed Doyle, Jr., Bill Morris
Instantiates
Publication
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Dimensions
28 cm.
Extent
1 v. (various pagings)
Media category
unmediated
Media MARC source
rdamedia
Other physical details
ill.
System control number
  • (NRN)DBW0986
  • (RLIN)UTBG92-B78352
  • (OCoLC)ocn135801226
Label
Microelectronics failure analysis techniques : a procedural guide, compiled & edited by Ed Doyle, Jr., Bill Morris
Publication
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Dimensions
28 cm.
Extent
1 v. (various pagings)
Media category
unmediated
Media MARC source
rdamedia
Other physical details
ill.
System control number
  • (NRN)DBW0986
  • (RLIN)UTBG92-B78352
  • (OCoLC)ocn135801226

Library Locations

    • Harold B. Lee Library Brigham Young University, Provo, UT, 84602, US
      40.249156 -111.649242
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